Description
Facilities for physical-chemical and microstructural characterization
Main technical characteristics
1 – 3 SEM, including an EDS-WDS-EBSD analytical SEM combining high-resolution imagery and strong current, and a FEG-SEM dedicated to imaging. Microscope stage for conducting in-situ micromechanical tests
2 – TEM (STEM, HAADF, EDS, EELS, EFTEM) equipped with a monochromator and a conventional microscope. Cryogenic or heated stages
3 – X-ray diffraction analysis laboratory including a θ-2θ diffractometer and a 6-circle diffractometer. High temperature chambers
4 – ICP/EOS plasma emission spectrometer, C/S and O/N analyzers
Contact Information